Method of and apparatus for testing electronic circuit assemblie

Details Method of and apparatus for testing electronic circuit assemblie Method of and apparatus for testing electronic circuit assemblie

1978-11-03

1980-11-25

Atkinson, Charles E.

Excavating

324 73R, 371 25, G01R 3128, G06F 1100

Patent

active

042362466

ABSTRACT:
A method and apparatus are disclosed for identifying and locating faults in the portion of circuit assemblies containing digital signals by conducting in-circuit tests embodying the application of uninterrupted sequences of signals to nodes of the circuits and the comparison of nodal signals to expected values, reducing the complex testing of the circuit assemblies to a series of simple tests of components or groups of components constituting the assemblies; and, in connection with bus-structured circuits, eliminating the possibility of bus contention problems in good circuit assemblies under test.

REFERENCES:
patent: 3714571 (1973-01-01), Walker
patent: 3832535 (1974-08-01), DeVito
patent: 3916306 (1975-10-01), Patti
patent: 4070565 (1978-01-01), Borrelli
patent: 4102491 (1978-07-01), DeVito et al.
patent: 4108358 (1978-08-01), Niemaszyk et al.
patent: 4125763 (1978-11-01), Drabing et al.

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