Method of and apparatus for testing a two dimensional pattern

Details Method of and apparatus for testing a two dimensional pattern Method of and apparatus for testing a two dimensional pattern

1975-06-26

1977-02-01

Richardson, Robert L.

Facsimile and static presentation processing

Facsimile

Specific signal processing circuitry

178DIG36, 178DIG37, 356168, H04N 702

Patent

active

040062961

ABSTRACT:
A method of and apparatus for testing a two dimensional pattern uses a pair of pick-up devices for scanning a reference pattern and the pattern to be tested. The reference pattern is modified relative to the test pattern and includes three types of pattern traces, i.e. narrow black traces, narrow bright traces and intermediate wide grey traces. The pattern is tested by means of the narrow traces only thereby minimizing positioning and scanning problems.

REFERENCES:
patent: 3309958 (1967-03-01), Simon
patent: 3546377 (1970-12-01), Troll
patent: 3617744 (1971-11-01), Irish
patent: 3823261 (1974-07-01), Bolsey
patent: 3849793 (1974-11-01), Ablett
patent: 3879133 (1975-04-01), Mathieu

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