Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent
1987-06-10
1989-05-23
McGraw, Vincent P.
Optics: measuring and testing
By dispersed light spectroscopy
Utilizing a spectrometer
250214C, G01J 332, G01N 2127
Patent
active
048324914
ABSTRACT:
A single beam wavelength scanning spectrophotometer comprises means for passing radiation from a radiation source (1) to a radiation detector (4) over a defined path which includes a monochromator (2) capable of being scanned across a selected wavelength range, means (7) for storing a first set of signals representative of the radiation falling on the radiation detector, the first set of signals being spread across the selected wavelength range to form a first spectral response, means for inserting a sample (3) in the defined path, means for producing a second set of signals representative of the radiation falling on the radiation detector when the sample (3) is inserted in the defined path, the second set of signals being spread across a selected wavelength range to form a second spectral response, and means (7) for calculating the transmittance or absorbance of the sample at desired wavelengths from the first and second spectral responses. The ambient temperature in the region of the radiation detector (5) is monitored (6) and the first and/or second sets of signals are modified in dependence on the ambient temperature when the first and second set of signals are produced.
REFERENCES:
patent: 3727066 (1973-04-01), Louderback et al.
patent: 4687333 (1987-08-01), Odasima et al.
Cooke Stephen J.
Sharpe Michael R.
McGraw Vincent P.
Miller Paul R.
U.S. Philips Corporation
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