Method of and apparatus for real-time crystallographic axis orie

Details Method of and apparatus for real-time crystallographic axis orie Method of and apparatus for real-time crystallographic axis orie

1987-08-27

1988-05-31

Rosenberger, R. A.

Optics: measuring and testing

Crystal or gem examination

Axes determination

356446, G01N 2101, G01N 2147

Patent

active

047476842

ABSTRACT:
A specific small area of a crystal sample is scanned by a laser beam which rotates about an axis substantially perpendicular to the sample surface such that the intersection of the beam with a plane above and parallel to the surface describes a true spiral or a stepwise spiral pattern. The laser beam is reflected different amounts for different beam positions to produce a reflectance pattern indicative of crystallographic orientation.

REFERENCES:
patent: 2973687 (1961-03-01), Pennington et al.
patent: 3124638 (1964-03-01), Loro
patent: 3782836 (1974-01-01), Fey et al.
patent: 4469442 (1984-09-01), Reich
Sopori, B. L., "Optical Diffraction Technique for Determination of Crystal rientations", Applied Optics, vol. 20, No. 10 (May 15, 1981), pp. 1758-1763.

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