Method of and apparatus for processing photoresist, method of ev

Photography – Fluid-treating apparatus – Fluid application to one side only of photographic medium

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396611, 118 52, G03D 500

Patent

active

060040475

ABSTRACT:
A resist processing method includes setting a substrate at a specific temperature, forming a resist film on the substrate by applying a resist solution onto the substrate while turning the substrate set at the specific temperature, heating the substrate on which the resist film has been formed, cooling the substrate a specific temperature after the heating process, wherein the thickness of the resist film on the substrate is measured between the heating process and the cooling process.

REFERENCES:
patent: 5143552 (1992-09-01), Moriyama
patent: 5633040 (1997-05-01), Toshima et al.
patent: 5939130 (1999-08-01), Shiraishi et al.
Patent Abstract of Japan, vol. 13, No. 496 (E-843), Nov. 9, 1989, JP-A-1-200623, Aug. 11, 1989.
Patent Abstract of Japan, vol. 13, No. 507 (E-845), Nov. 14, 1989, JP-A-1-204420, Aug. 17, 1989.

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