Method of and apparatus for multiplexed automatic testing of ele

Details Method of and apparatus for multiplexed automatic testing of ele Method of and apparatus for multiplexed automatic testing of ele

1985-03-13

1986-10-28

Atkinson, Charles E.

Excavating

324 73R, 371 15, G01R 3128

Patent

active

046203044

ABSTRACT:
This disclosure is concerned with the automatic testing of electronic circuits and assemblies and the like containing large numbers of nodes, with reduced replications of test instruments and thus significantly reduced cost, through permitting a number of driver-sensors to be selectively switched to a larger number of nodes of the circuit being tested in accordance with a method of specifying and allocating the connections of the nodes of that circuit to the pins associated with each driver-sensor (or group thereof) that insures that no conflicts arise in connecting the driver-sensors to various groups of nodes for carrying out the desired tests.

REFERENCES:
patent: 4300207 (1981-11-01), Eivers et al.
patent: 4339819 (1982-07-01), Jacobson
patent: 4354268 (1982-10-01), Michel et al.
patent: 4392107 (1983-07-01), Gollomp
patent: 4397021 (1983-08-01), Lloyd et al.

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