Method of and apparatus for measuring the shape of a wavefront

Details Method of and apparatus for measuring the shape of a wavefront Method of and apparatus for measuring the shape of a wavefront

1986-03-17

1988-05-17

Willis, Davis L.

Optics: measuring and testing

By dispersed light spectroscopy

Utilizing a spectrometer

382 43, G01B 902

Patent

active

047446595

ABSTRACT:
Two light beams capable of interference with each other are applied to an area sensor while they are inclined to each other. The area sensor reads a pattern of interference fringes formed by the two light beams. The read interference fringe pattern is subjected to a Fourier transform, and then an inclination-related component is removed therefrom. Thereafter, an inverse Fourier transform is effected. The shape of the wavefront of light to be measured is determined on the basis of a phase difference between the two light beams which is known from the result of the inverse Fourier transform.

REFERENCES:
patent: 3923400 (1975-12-01), Hardy
patent: 4513441 (1985-04-01), Henshaw
patent: 4523846 (1985-06-01), Breckinridge et al.
"Interferometric Examination of Lenses, Mirrors, and Optical Systems", Forman, SPIE, vol. 163, 4-1979, pp. 103-111.

Affiliated with

Also associated with

Rating

Method of and apparatus for measuring the shape of a wavefront does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method of and apparatus for measuring the shape of a wavefront, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of and apparatus for measuring the shape of a wavefront will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-1877968