Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – Analysis of complex waves
Patent
1989-07-14
1991-07-23
Williams, Hezron E.
Electricity: measuring and testing
Measuring, testing, or sensing electricity, per se
Analysis of complex waves
G01R 2316
Patent
active
050346784
ABSTRACT:
A system for measuring the frequency response of an electrooptic device, such as an optical detector, includes an optical amplifier for generating an optical white noise spectrum that is delivered to the detector. In a first embodiment, an optical amplifier or a luminescent fiber amplifier generates a white noise signal due to spontaneous-spontaneous beat noise emission, while a second embodiment utilizes the signal-spontaneous and spontaneous-spontaneous beat noise emissions generated by an optical amplifier driven by a laser source. The frequency response of the detector is determined from a measurement of the detected noise signal wherein any roll-off in the response must be due to the detector since the originally generated noise spectrum is flat.
REFERENCES:
patent: 4678937 (1987-07-01), Price
patent: 4946459 (1990-08-01), Nelson et al.
Burrus et al., "Improved Very-High Speed . . . ", Elect. Lett. 21(7), pp. 262-263 (1985).
Piccari and Spano, "New Method for Measuring Ultrawide . . . ", Elect. Lett. 18(3), pp. 116-118 (1982).
Peyton et al., "High-Sensitivity Receiver . . . ", IEEE J. of Quantum Elec. QE-8, No. 2, pp. 252-263 (1972).
Peyton, "Wideband Infrared Heterodyne . . . ", Final Report for NASA Contract NAS-5-23119 (Aug. 1974).
Kaneda et al., "Avalanche Buildup Time . . . ", J. Applied Physics, vol. 47, No. 11, pp. 4960-4963 (1976).
Eichen and Silletti, "Bandwidth Measurements of Ultra-High Frequency . . . ", J. Lightwave Tech. LT-5(10), pp. 1377-1381 (1987).
Anderson et al., "Temporal and Frequency Response . . . ", Appl. Optics 19(20), pp. 3496-3499 (1980).
Blauvett et al., "Fabrication and Characterization . . . ", Appl. Phys. Lett. 45(3), pp. 195-196 (1984).
Eichen Elliot
McCabe John
Rideout William
Schlafer John
Arana Louis M.
GTE Laboratories Incorporated
Lohmann, III Victor F.
Williams Hezron E.
LandOfFree
Method of and apparatus for measuring the frequency response of does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method of and apparatus for measuring the frequency response of , we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of and apparatus for measuring the frequency response of will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-434532