Optics: measuring and testing – For optical fiber or waveguide inspection
Patent
1985-06-04
1987-04-14
McGraw, Vincent P.
Optics: measuring and testing
For optical fiber or waveguide inspection
G01N 2184
Patent
active
046573887
ABSTRACT:
The cut-off wavelength of the first higher order mode in optical fibers for telecommunication is measured based on the fact that the introduction of perturbations in an optical fiber can generate greater losses on higher order modes than on the lower order modes. A spectral scanning of the fiber output power is effected under a certain number of different perturbations conditions and the values obtained are combined so as to determine the fraction of power guided in the fundamental mode. The cut-off wavelength is that where this fraction exceeds a certain value.
REFERENCES:
"Une Technique Nouvelle pour la Mesure de la Longueur d'Onde de Coupure des Fibres Monomodes"-paper presented by G. Grosso et al, ECOC Cannes, Sep. 1982.
"Polarization Measurement of Cut-Off Wavelength in Monomode Fibers", paper presented by Coppa et al (instant inventors), at ECOC Geneva, Oct. 1983.
"New Method for Measuring V-Value of a Single-Mode Optical Fibre"-article by Y. Tatsuyama et al (Electronics Letters, Dec. 1976).
Coppa Gianni
Di Vita Pietro
Cselt-Centro Studi e Laboratori Telecomunicazioni SpA
Dubno Herbert
McGraw Vincent P.
Ross Karl F.
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