Method of and apparatus for measuring planarity of strip,...

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Mechanical measurement system

Reexamination Certificate

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C073S037500, C072S006100

Reexamination Certificate

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06853927

ABSTRACT:
A method of measuring planarity of strip in a strip-rolling line or a strip-processing line in which a measuring beam, a plurality of measuring beams or discrete measuring pins in an inclined pattern across a measuring roller, measures the tension forces acting upon the strip to form a force summation foundation across the strip width. A tension distribution function is derived from the force summation function by taking derivatives of the force-summation function with respect to the width dimension of the strip and, if desired, dividing that derivative by the thickness of the strip.

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patent: 6164104 (2000-12-01), Noe et al.
patent: 6668626 (2003-12-01), Grefve et al.

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