Optics: measuring and testing – Inspection of flaws or impurities – Transparent or translucent material
Patent
1994-08-26
1995-11-28
Evans, F. L.
Optics: measuring and testing
Inspection of flaws or impurities
Transparent or translucent material
G01N 2188
Patent
active
054712971
ABSTRACT:
A method of measuring optical distortion of measured material by disposing a background screen (2) having a predetermined regular pattern (3) in rear of a measured material (1) having light transmission properties; disposing an image pick-up device (4) capable of line-scanning in front of the measured material (1); taking a picture of the background screen through the measured material (1) by successively line-scanning the entirety of a range to be measured of the measured material (1) with the image pick-up device (4), and measuring the optical distortion of the measured material (1) on the basis of data in the picture, wherein the regular pattern (3) of the background screen is composed of triangle-wave-like unit patterns (3a), each extending continuously in a predetermined direction, which are arranged at distances of equal pitch.
REFERENCES:
patent: 4461570 (1984-07-01), Task et al.
patent: 4647197 (1987-03-01), Kitaya et al.
patent: 4776692 (1988-10-01), Kalawsky
Asahi Glass Company Ltd.
Evans F. L.
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