Method of and apparatus for making wavelength-resolved...

Optics: measuring and testing – By light interference – Spectroscopy

Reexamination Certificate

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C356S073100, C356S491000, C356S477000

Reexamination Certificate

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06856398

ABSTRACT:
Apparatus for making wavelength-resolved polarimetric measurements comprises an interferometric source (10,12), for example a broadband source (10) and an optical interferometer unit (12), and a polarization generator unit (16) for generating different states of polarization of light received from the interferometric source and applying same to a device-under-test (30). A polarimeter unit (20) receives and polarimetrically-analyzes light from the device-under-test, converts the polarimetrically-analyzed light into electrical signals, and, using Fast Fourier Transform numerical analysis, computes therefrom the wavelength-resolved polarimetric measurements. Placing the optical interferometer unit (10,12) “upstream” not only of the device-under-test (30), but also of the polarisation generator unit (16), means that the latter substantially eliminates polarization dependent effects introduced by the former. The polarimeter (20) can still perform the necessary transformation even though the interferogram has been passed through the polarisation generator unit and the device-under-test.

REFERENCES:
patent: 4523847 (1985-06-01), Bjorklund et al.
patent: 6323950 (2001-11-01), Kim et al.
patent: 6490043 (2002-12-01), Kebabian
patent: 6606158 (2003-08-01), Rosenfeldt et al.
patent: 6762829 (2004-07-01), Babin et al.
patent: 20030075676 (2003-04-01), Ruchet et al.
Cyr, N; Ruchet B; Girard A; Schinn G.W., “Poincare Sphere Analysis: Application to PMD Measurements of DWDM Components and Fibers”, Proceedins of SubOptic 2001, pp 557-574.*
“Poincare Sphere Analysis: Application to PMD Measurements of DWDM components and Fibers” Cyr, N.; Ruchet, B.; Girard, A.; Schinn, G.W.

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