Optics: measuring and testing – By particle light scattering – With photocell detection
Patent
1977-06-13
1978-12-05
Clark, Conrad J.
Optics: measuring and testing
By particle light scattering
With photocell detection
356307, G01B 902
Patent
active
041283376
ABSTRACT:
A method of detecting a small elemental spectral source in a larger, spectral background, including producing a first interferogram of each element of an object area including the source and background; producing a second complementary interferogram of each element of that object area; projecting onto a detector images of the first and second interferograms and defocussing one of the first and second interferograms for providing a fluctuating elemental interferogram output from each element of the detector which receives an interferogram derived from the element of the object area that contains a source which spectrally distinguishes from the background, while reducing the output corresponding to each element containing no source to a constant and non-fluctuating level.
REFERENCES:
patent: 3588252 (1971-06-01), Habosian
patent: 3753619 (1973-08-01), Thorpe et al.
patent: 4009962 (1977-03-01), Lauer
patent: 4029416 (1977-06-01), Hawes
Clark Conrad J.
Iandiorio Joseph S.
Visidyne, Inc.
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