Method of and apparatus for diagnosing failures in read only mem

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G01R 3128

Patent

active

048766844

ABSTRACT:
A semiconductor memory such as a read only memory (ROM) is tested and faults are diagnosed and identified by examining data stored therein for patterns that could not exist if the memory is faulty, proving the memory to be functional by counterexample. Diagnosis is carried out using probabilistic algorithms that terminate quickly if the memory is not faulty, with any pathological contents of the memory masked to minimize the likelihood of misdiagnosis. Faults diagnosed in accordance with the invention include stuck or tied data or address lines.

REFERENCES:
patent: 4061908 (1977-12-01), deJonge
patent: 4298980 (1981-11-01), Hajdu
patent: 4618954 (1986-10-01), Otobe
patent: 4715034 (1987-12-01), Jacobson
patent: 4782486 (1988-11-01), Lipcon

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