Measuring and testing – Frictional resistance – coefficient or characteristics
Patent
1976-03-05
1977-05-31
Queisser, Richard C.
Measuring and testing
Frictional resistance, coefficient or characteristics
73160, G01N 1902, G01L 506
Patent
active
040261417
ABSTRACT:
A method of and apparatus for testing a moving elongate strip of material to determine the coefficient of friction with respect to a control sample having known surface characteristics with a predetermined correlation to the surface characteristics normally encountered by the strip of material in use or processing, and/or the proportion of increased tension caused by movement of the strip in contact with the control sample to the original tension in the strip are provided by this invention. This determination is made by moving the elongate strip of material under tension of any magnitude in sliding frictional engagement with the control sample which moves in response to unbalanced forces generated by the incoming tension and the sliding frictional engagement along a predetermined path of travel, preferably arcuate, until the forces exerted on the control sample become balanced at a given position along the path of travel. The moving strip of material is guided to and from the control sample along respective non-parallel guide paths, with the respective angles of the guide paths changing as the control sample moves along its path of travel until the angles of the respective guide paths become such, with respect to the predetermined path of the control sample, that the forces exerted on the control sample become balanced. The coefficient of friction of the strip of material with respect to the control sample and/or the proportion of increased tension to original tension, are determined and indicated by the position of the control sample along its path of travel when the forces exerted thereon become balanced.
REFERENCES:
patent: 2378614 (1945-06-01), Zahn
patent: 2428379 (1947-10-01), Naumann
patent: 3526129 (1970-09-01), Anderson
patent: 3831444 (1974-08-01), Sasaki et al.
Appleman John S.
Queisser Richard C.
Renfro Corporation
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