Method of and apparatus for detecting defect of transparent shee

Optics: measuring and testing – Inspection of flaws or impurities – Having predetermined light transmission regions

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Details

356430, 250562, 250563, G01N 2100

Patent

active

056918119

ABSTRACT:
A method of detecting a defect of a transparent sheet is provided in which light source casts light on a transparent sheet through a slit plate, a camera receives the light transmitted through the transparent sheet and produces an image for inspection of a defect, an image of the slit plate produced by the camera is out of focus and represented by a waveform which is representative of brightness of the light transmitting portions and shading portions of the slit plate, and the camera is set to focus on a point where the difference between a maximum brightness and a minimum brightness represented by the waveform becomes minimum or on a point adjacent thereto. An apparatus for detecting a defect of a transparent sheet is also provided.

REFERENCES:
patent: 5452079 (1995-09-01), Okugawa

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