Optics: measuring and testing – Inspection of flaws or impurities
Patent
1997-09-29
2000-05-16
Kim, Robert H.
Optics: measuring and testing
Inspection of flaws or impurities
3562372, 3562381, G01N 2100
Patent
active
060644788
ABSTRACT:
In a method of and an apparatus for detecting three-dimensional defects in he automatic inspection of moving surfaces by means of a color vision system the surface of a moving test specimen which is to be inspected is illuminated with light of different colors simultaneously from at least two different directions, such that edges of three-dimensional defects on the surface appear with a different coloring, and on the basis of the altered coloring, at least two channels of the color image are evaluated to detect three-dimensional defects and to differentiate same from planar defects.
REFERENCES:
patent: 5245671 (1993-09-01), Kobayashi
patent: 5298963 (1994-03-01), Moriya et al.
patent: 5315384 (1994-05-01), Heffington et al.
Geisselmann Heribert
Paul Detlef
Fraunhofer-Gesellschaft zur Forderung der ange-wandten Forschung
Kim Robert H.
Merlino Amanda
Spectra-Physics VisionTech Oy
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