Electricity: measuring and testing – Using ionization effects – For analysis of gas – vapor – or particles of matter
Patent
1990-08-30
1992-06-16
Wieder, Kenneth A.
Electricity: measuring and testing
Using ionization effects
For analysis of gas, vapor, or particles of matter
250283, 210 961, B01D 4900
Patent
active
051227525
ABSTRACT:
A method of and an apparatus for analyzing a granular material contained in a sample of a medium such as water produced by an ultra-pure water producing apparatus includes the steps of adding energy to granular materials contained in a sample which is mixed with the medium, wherein the energy is set to be lower than the breakdown threshold of the medium and to be higher than the breakdown threshold of the granular materials, detecting ions which are generated with the breakdown of the granular materials by using a pair of positive and negative electrodes; and analyzing characteristics of the granular materials based on the ions.
REFERENCES:
patent: 2387550 (1945-10-01), Windler
patent: 2950387 (1960-08-01), Brubaker
patent: 2959677 (1960-11-01), Robinson et al.
patent: 3859526 (1975-01-01), Hirschfield
patent: 3948625 (1976-04-01), Schultz
patent: 4160161 (1979-07-01), Horton
patent: 4259573 (1981-03-01), Prober et al.
patent: 4320394 (1982-03-01), John, Jr.
patent: 4574004 (1986-02-01), Schmidt-Off et al.
patent: 4713548 (1987-12-01), Kim et al.
patent: 4996422 (1991-02-01), Mitsui et al.
Kitamori Takehiko
Koga Masataka
Matsui Tetsuya
Nishitarumizu Tsuyoshi
Sakagami Masaharu
Hitachi , Ltd.
Regan Maura K.
Wieder Kenneth A.
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