Data processing: measuring – calibrating – or testing – Measurement system – Performance or efficiency evaluation
Reexamination Certificate
2005-01-04
2005-01-04
Raymond, Edward (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system
Performance or efficiency evaluation
C324S076420
Reexamination Certificate
active
06839657
ABSTRACT:
A method of and an arrangement for characterizing non-linear behavior of RF and microwave devices under test in a near matched environment. The method comprises the steps of exciting the device by an RF signal under different load conditions, measuring signal data at input and output ports of the device, verifying whether the measurement data meet predetermined quality criteria; calculating, from the measurement data, model parameters of a predetermined model for characterizing the non-linear behavior of the device, and verifying assumptions made in the characterization model by collecting additional measurement data and comparing same with data calculated from the model using the model parameters calculated. The load conditions are obtained by connecting to the output port of the device a matched load, an open, a short and a plurality of attenuators and delays.
REFERENCES:
patent: 5276411 (1994-01-01), Woodin, Jr. et al.
patent: 6025709 (2000-02-01), Bradley
patent: 6613593 (2003-09-01), Tanaka et al.
patent: 6629009 (2003-09-01), Tamaki
patent: 6635872 (2003-10-01), Davidson
patent: 6639393 (2003-10-01), Tasker et al.
patent: 0 321 808 (1989-06-01), None
patent: 0 715 177 (1996-06-01), None
patent: WO 8808969 (1988-11-01), None
Fritz, S., Examiner. European Search Report, application No. EP 01 20 3651, dated Apr. 19, 2002.
Ferrero et al. “Novel Hardware and Software solutions . . . ” IEEE Inc. New York, vol. 43, no. 2, Apr. 1, 1994, pp. 299-305, XP000439069.
Teeter D A et al. “Prediction of HBT ACPR . . . ” Technical Digest, New York, Oct. 12, 1997, pp. 41-44, XP010251622.
Berghoff G et al. “Automated Characterization of HF Power Transistors . . . ” IEEE Inc. vol. 46, no. 12, Dec. 1998, pp. 2068-2073, XP000793237.
Verbeyst Frans
Verspecht Jan
Agilent Technologie,s Inc.
Raymond Edward
LandOfFree
Method of and an arrangement for characterizing non-linear... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method of and an arrangement for characterizing non-linear..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of and an arrangement for characterizing non-linear... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3414628