Method of and an apparatus for measuring surface contour

Details Method of and an apparatus for measuring surface contour Method of and an apparatus for measuring surface contour

1993-10-12

1995-11-14

Cosimano, Edward R.

Boots, shoes, and leggings

36447403, 36447402, 36447436, 36457101, 36457105, 356360, 356376, 356377, G01B 5008

Patent

active

054672899

ABSTRACT:
A measurement-datum similar to profile of a measuring object set in a measuring area in which a detector and the measuring object are moved relatively is formed to measure the displacement value between the detector and the measuring object through the relative movement based on the measurement-datum to thereby compute the surface contour of the measuring object from the measured data with reference to the measurement-datum. Since the measurement-datum is set in the spatial area, a precise mechanical processing will not be required for an accurate measurement of the measuring object having a strange profile which was not measured by conventional apparatus.

REFERENCES:
patent: 4908951 (1990-03-01), Gurny
patent: 4945501 (1990-07-01), Bell et al.

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