Data processing: measuring – calibrating – or testing – Measurement system – Dimensional determination
Patent
1997-06-02
1999-11-02
Trammell, James P.
Data processing: measuring, calibrating, or testing
Measurement system
Dimensional determination
702167, 356357, 356371, G01B 528
Patent
active
059787503
ABSTRACT:
Apparatus and method of determining the surface condition of a workpiece, operate by measuring a roughness profile of the surface across a certain measuring distance, splitting up the roughness profile into wave frequencies and amplitudes associated with them, dividing the wave frequencies into wave frequency ranges, and determining the surface condition of the workpiece based on the amplitudes in the respective wave frequency ranges. The roughness profile may be understood as the superpositioning of harmonic oscillations having certain wavelengths and amplitudes. By subjecting them to a Fourier analysis, these harmonic oscillations are split up into their wave frequencies and associated amplitudes. Then wave frequency ranges are combined to form bands such that a high intensity in one of the bands each corresponds to a certain physical appearance of the surface. The invention thus provides an objective, calculable measure of the surface condition of a workpiece.
REFERENCES:
patent: 5398113 (1995-03-01), De Groot
patent: 5402234 (1995-03-01), Deck
patent: 5488476 (1996-01-01), Mansfield et al.
patent: 5858517 (1999-01-01), Tagusari
Nguyen Cuong H.
Trammell James P.
Wagner International AG
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