Method of and an apparatus for an optical measuring of a positio

Details Method of and an apparatus for an optical measuring of a positio Method of and an apparatus for an optical measuring of a positio

1987-02-05

1989-01-24

Evans, F. L.

Optics: measuring and testing

By polarized light examination

With light attenuation

33125A, 33125C, 250237G, G01B 1100

Patent

active

047997982

ABSTRACT:
The method of measuring positions is based on tracking an interference pattern which is generated when line grids is different line densities are superimposed. According to the present method the line grid of an optical scale is projected onto a line grid formed by a plurality of adjacently arranged diodes, whereby digital switching elements are allocated to the photodiodes and are integrated with same on a common substrate and which compare pair-wise the intensities of adjacent diodes. An absolute measuring of positions proceeds by an additional coding of the line grid of the scale. The method has use in linear as well as curvilinear (angular) measuring of positions.

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