Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2005-10-25
2005-10-25
Hoff, Marc S. (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C324S612000
Reexamination Certificate
active
06959250
ABSTRACT:
In contrast with a known dynamic gate-level simulation method, a method of analyzing electromagnetic interference (an EMI analysis method) according to the present invention enables estimation of EMI noise, by means of calculating signal propagation of each node through use of the signal propagation probability technique, and calculating variation time of each node through use of “the Static timing analysis technique”. In short, the present invention is characterized in calculating a frequency characteristic from the relationship between toggle probability of each node and delay in each node.
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Hirano Shouzou
Kojima Seijirou
Shimazaki Kenji
Tsujikawa Hiroyuki
Baran Mary Catherine
Hoff Marc S.
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