Method of analyzing an object by use of scattering light

Details Method of analyzing an object by use of scattering light Method of analyzing an object by use of scattering light

1981-08-11

1983-10-25

Sikes, William L.

Optics: measuring and testing

By particle light scattering

With photocell detection

356318, G01N 2149

Patent

active

044115253

ABSTRACT:
A light beam having a limited diameter impinges upon and transmits through an object and scattering light carrying information regarding the internal structure or composition of the sample is obtained from the sample. The scattering light is photoelectrically detected by a detecting system through an observation optical system.

REFERENCES:
patent: 4030827 (1977-06-01), Delhaye et al.
patent: 4049350 (1977-09-01), Bruck
Vzgiris, "Sensitive Optical Heterodyne Method for Light Scattering Studies", Rev. Sci. Instru, vol. 43, No. 9, pp. 1383-1385, Sep. 1972.
Shepherd, "Raman Scattering Techniques Applied to Problems in Solid State Physics", Applied Optics, vol. 11, No. 9, pp. 1924-1927, Sep. 1972.
Fowler et al., "Analytical Technique for Probing and Controlling Gas Composition in Chemical Processes", IBM Tech. Discl. Bull., vol. 15, No. 12, pp. 3885-3886, May 1973.
Okada et al., "Signal-to-Noise Ratio Improvement . . .", J. Spec. Soc. Japan, vol. 25, No. 4, pp. 194-200, 1976.

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