Method of analyzing an electroretinogram

Details Method of analyzing an electroretinogram Method of analyzing an electroretinogram

1988-03-23

1989-07-11

Bovernick, Rodney B.

Optics: eye examining, vision testing and correcting

Eye examining or testing instrument

Methods of use

351205, 351211, 351243, 128745, A61B 314, A61B 310, A61B 302

Patent

active

048465682

ABSTRACT:
A method of separating an oscillatory potential wave from an electroretinogram of a subject which contains an "a" wave, a "b" wave and said oscillatory potential wave that overlap each other. The electroretinogram ([1]) is produced by light stimulation to the retina of an eye of the subject, and is detected by a suitable device. The peak-to-peak distances of the detected electroretinogram are determined, and a mean period (T) of the oscillatory potential wave ([10]) to be separated from said electroretinogram is obtained. Then, a tentative start point (A) of the oscillatory potential wave is determined, and an OP-free waveform ([7], [9]) free of said oscillatory potential wave is obtained by obtaining moving averages of a first intermediate waveform ([6], [8]) which is determined based on the electroretinogram and the determined tentative start point (A). The oscillatory potential wave ([10]) is extracted by subtracting the OP-free waveform ([7], [9]) from the electroretinogram ([1]).

REFERENCES:
patent: 4676611 (1987-06-01), Nelson et al.

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