Method of analysis of a sample of insulating material by photoel

Details Method of analysis of a sample of insulating material by photoel Method of analysis of a sample of insulating material by photoel

1976-12-17

1978-06-27

Smith, Alfred E.

Radiant energy

Electron energy analysis

H01J 3900

Patent

active

040977382

ABSTRACT:
The method consists in subjecting a sample of insulating material to photon radiation and in measuring the energy of the photoelectrons emitted by the sample under the action of the radiation. The sample is fixed on a metal sample-holder having a shape such that a portion of this latter is subjected to radiation. The emission of electrons of low energy is thus initiated and the positive charges which appear at the surface of the samples with the emitted electrons are neutralized by creating in the vicinity of the sample surface a space zone in which the electric field is substantially zero.

REFERENCES:
patent: 3749926 (1973-07-01), Lee
patent: 3822383 (1974-07-01), Koike

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