Method of alternating track write for defect identification

Details Method of alternating track write for defect identification Method of alternating track write for defect identification

2008-05-18

2010-11-23

Negrón, Daniell L (Department: 2627)

Dynamic magnetic information storage or retrieval

Monitoring or testing the progress of recording

C360S053000

Reexamination Certificate

active

07839588

ABSTRACT:
Defects are identified in a disk drive by first writing a pattern of tracks to a disk surface in the disk drive, the pattern of tracks including written tracks alternating with unwritten tracks. The written tracks of the pattern of tracks are read, and a defect in a portion of a first written track is detected. An unread portion of a first unwritten track is then identified as comprising a defect based at least in part on the defect in the first written track, the first unwritten track located proximate the first written track.

REFERENCES:
patent: 5150050 (1992-09-01), Genheimer et al.
patent: 5216655 (1993-06-01), Hearn et al.
patent: 5280395 (1994-01-01), Matsuzaki
patent: 5895438 (1999-04-01), Yomtoubian
patent: 6104556 (2000-08-01), Schaenzer et al.
patent: 6219814 (2001-04-01), Coker et al.
patent: 6223303 (2001-04-01), Billings et al.
patent: 6239931 (2001-05-01), Chung et al.
patent: 6301679 (2001-10-01), Tan
patent: 6366081 (2002-04-01), Tan et al.
patent: 6384999 (2002-05-01), Schibilla
patent: 6405342 (2002-06-01), Lee
patent: 6606211 (2003-08-01), Lim et al.
patent: 6691255 (2004-02-01), Rothberg et al.
patent: 6704153 (2004-03-01), Rothberg et al.
patent: 6731442 (2004-05-01), Jin et al.
patent: 6940669 (2005-09-01), Schaenzer et al.
patent: 6950967 (2005-09-01), Brunnett et al.
patent: 7072129 (2006-07-01), Cullen et al.
patent: 7215619 (2007-05-01), Van Den Enden
patent: 2001/0046196 (2001-11-01), McKernan
patent: 2004/0153949 (2004-08-01), Ro et al.
patent: 2006/0056088 (2006-03-01), Kudoh et al.
patent: 2006/0126204 (2006-06-01), Taniguchi et al.
patent: 2007/0089031 (2007-04-01), Huffman et al.

Affiliated with

Also associated with

Rating

Method of alternating track write for defect identification does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method of alternating track write for defect identification, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of alternating track write for defect identification will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-4179801