Method of aligning probe for eddy current inspection

Details Method of aligning probe for eddy current inspection Method of aligning probe for eddy current inspection

2006-08-23

2010-02-02

Cosimano, Edward R (Department: 2863)

Data processing: measuring, calibrating, or testing

Calibration or correction system

Sensor or transducer

C073S001010, C324S200000, C702S033000, C702S035000, C702S038000, C702S085000, C702S127000, C702S189000

Reexamination Certificate

active

07657389

ABSTRACT:
A system and method using a touch probe device for eddy current inspection. The touch probe provides a simple approach for coming within close contact of the specimen while maintaining a normal angle and pressure at the right positions. The use of the touch probe further reduces the total time for the eddy current inspection. The touch probe aligns the probe to a specimen to be inspected, for the purpose of reducing measurement errors and increasing productivity.

REFERENCES:
patent: 5481916 (1996-01-01), Macecek et al.
patent: 6907358 (2005-06-01), Suh et al.

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