Method of aligning a substrate, a computer program, a device...

Radiant energy – Photocells; circuits and apparatus – Photocell controls its own optical systems

Reexamination Certificate

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C250S559300

Reexamination Certificate

active

07041996

ABSTRACT:
While the alignment beam is focused on a mark on the substrate table, the substrate table is moved substantially perpendicularly to the alignment beam. If the image of the mark moves relative to a reference mark, then the substrate and the alignment beam are not perpendicular. The mark on the substrate table is aligned to a plurality of reference marks. At least two substrate marks are then aligned with a single reference mark. Errors due to the inclination of the alignment beam are eliminated from the expansion and rotation values calculated for the substrate.

REFERENCES:
patent: 5225686 (1993-07-01), Edo
patent: 5235408 (1993-08-01), Matsugu et al.
patent: 5715037 (1998-02-01), Saiki et al.
patent: 5801816 (1998-09-01), Shiraishi
patent: 6376329 (2002-04-01), Sogard et al.
patent: 62-58624 (1987-03-01), None
patent: 6-132197 (1994-05-01), None
patent: 10-10746 (1998-01-01), None
Derwent Abstract Accession No. 98-205204/18, RD 407007 A (ANON) Mar. 10, 1998.
A copy of European Search Report dated Jul. 25, 2003.
English language translated Japanese Office Action dated Sep. 16, 2005.

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