X-ray or gamma ray systems or devices – Accessory – Alignment
Patent
1986-02-25
1989-02-28
Fields, Carolyn E.
X-ray or gamma ray systems or devices
Accessory
Alignment
378145, 378152, G21K 100
Patent
active
048093149
ABSTRACT:
An X-ray inspection system includes an X-ray source for generating a directed X-ray beam and a linear array detector for measuring the intensity of the received radiation and generating electrical signals representative thereof. A method for aligning the detector with the directed X-ray beam includes removing any part between the X-ray source and the detector, opening an X-ray beam limiter, positioning the linear array detector for maximum signal from each detector element, reducing the X-ray beam limiter opening, detecting whether any signal from a detector element is reduced, moving the limiter for producing a maximum signal on each signal, securing the X-ray beam limiter, and positioning the detector array for maximum signal.
REFERENCES:
patent: 4675892 (1987-06-01), Plessis et al.
Keaveney John P.
Oliver David W.
Steele Douglas S.
Fields Carolyn E.
General Electric Company
Herkamp Nathan D.
Lawrence Derek P.
Porta David P.
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