Method of acceleration testing of reliability of LSI

Details Method of acceleration testing of reliability of LSI Method of acceleration testing of reliability of LSI

1992-01-23

1993-10-05

Nguyen, Vinh

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

324 731, G01R 3100

Patent

active

052508951

ABSTRACT:
A method of acceleration testing of reliability of an LSI adopting a microprogram is realized simply. In a test mode, a microaddress is progressively incremented "1" by "1" and data processing within the LSI is executed in accordance with a microcode read out from a control memory based on the microaddress. As for a command decoder and an address generator, external data terminals are clamped to a voltage source or to a ground to permit a specific command to be fetched by the LSI under test. In this way, a majority of internal gates within the LSI are activated while the acceleration test is being conducted on the LSI.

REFERENCES:
patent: 4862071 (1989-08-01), Sato et al.
patent: 4949033 (1990-08-01), Kono et al.

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