Method of accelerated testing of illuminated device components

Details Method of accelerated testing of illuminated device components Method of accelerated testing of illuminated device components

2006-10-24

2006-10-24

Williams, Hezron (Department: 2856)

Measuring and testing

Simulated environment

C073S866000, C250S492100, C250S492200, C356S051000, C445S006000

Reexamination Certificate

active

07124651

ABSTRACT:
Methods and devices for accelerated light stability testing are described. The method comprises exposing a component to light having a total irradiance at wavelengths between 300 nm and 500 nm wherein the irradiance at wavelengths ranging from 300 nm to 350 nm is less than 3.1% of the total irradiance; the irradiance at wavelengths ranging from greater than 350 nm to 380 nm ranges from 0.2% to 2.2% of the total irradiance; the irradiance at wavelengths ranging from greater than 380 nm to 420 nm ranges from 4.5% to 9.1% of the total irradiance; and the irradiance at wavelength ranging from greater than 420 nm to 500 nm ranges from about 86% to about 95% of the total irradiance.

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