Method for X-ray fluorescence spectroscopy

Boots – shoes – and leggings

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

250253, 378 48, G06F 1546, G01N 2300

Patent

active

045105731

ABSTRACT:
A method and apparatus are described for performing X-ray fluorescence analysis where the physical relationship between the source/detector and the object being examined is not controlled. This technique and apparatus is particularly advantageous in performing an in situ analysis of the concentration of one or more elements present in a matrix of a material such as rock. In accordance with this aspect of our invention, such a mineral assay is performed by drilling a borehole into the matrix, inserting into the borehole a probe containing a suitable XRF source/detector, irradiating the matrix, detecting the spectrum of radiation that is produced and analyzing this spectrum. Preferably, the concentration of the assayed element is determined from the following formula: ##EQU1## where S is the number of photons counted having energies in a signal range where the X-ray spectral line of the assayed element is observed, C is the number of photons counted in a range where a radiation peak is observed, B is the number of photons counted in a background range, E is the number of photons counted in a range adjacent that where said radiation peak is observed, and K.sub.1 through K.sub.6 are empirically determined constants relating to the performance of the probe.

REFERENCES:
patent: 3703726 (1972-11-01), Stephenson
patent: 4016419 (1977-04-01), Kotani et al.
patent: 4021667 (1977-05-01), Clausen et al.
patent: 4031367 (1977-06-01), Murphy
patent: 4045676 (1977-08-01), Rolle
patent: 4066892 (1978-01-01), Givens
patent: 4349736 (1982-09-01), Miller
patent: 4362935 (1982-12-01), Clark
Technical Instructions on Conducting Geophysical Testing in Boreholes, Gosgeotechizdat, Moscow, 1963, pp. 18-21, 56-59, 208.
Quantitative X-ray Fluorescence Analysis, N. F. Lossev, "Nauka", Publishers, Moscow, 1969, p. 131.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method for X-ray fluorescence spectroscopy does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method for X-ray fluorescence spectroscopy, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for X-ray fluorescence spectroscopy will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-1173485

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.