Method for weaving substrates with integral sidewalls

Fabric (woven – knitted – or nonwoven textile or cloth – etc.) – Woven fabric – Woven fabric is characterized by a particular or...

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C442S203000, C442S246000, C139S38400B

Reexamination Certificate

active

07964520

ABSTRACT:
The present invention generally relates to an integrally woven three-dimensional preform with at least one sidewall in at least one direction constructed from a woven base fabric comprising two or more layers, and a method of forming thereof. A plurality of fibers in a first direction is interwoven between at least the top layer and a second layer, such that top layer is foldable relative to the other layers and form, upon folding, an integral sidewall. A plurality of fibers may also be interwoven between the second-from-the-top layer and a second layer, such that the second-from-the-top layer is foldable relative to the other layers, upon folding, form a second integral sidewall perpendicular to the first integral sidewall. The preform may optionally comprise a plurality of non-integral sidewalls formed by folding portions of the topmost layer.

REFERENCES:
patent: 4256790 (1981-03-01), Lackman et al.
patent: 4331495 (1982-05-01), Lackman et al.
patent: 4788101 (1988-11-01), Sakatani et al.
patent: 4922968 (1990-05-01), Bottger et al.
patent: 4958663 (1990-09-01), Miller et al.
patent: 5085252 (1992-02-01), Mohamed et al.
patent: 5121530 (1992-06-01), Sakatani et al.
patent: 5126190 (1992-06-01), Sakatani et al.
patent: 5236020 (1993-08-01), Sakatani et al.
patent: 5343897 (1994-09-01), Sakatani et al.
patent: 5348056 (1994-09-01), Tsuzuki
patent: 5429853 (1995-07-01), Darrieux
patent: 5772821 (1998-06-01), Yasui et al.
patent: 5783279 (1998-07-01), Edgson et al.
patent: 5785094 (1998-07-01), Yoshida
patent: 5899241 (1999-05-01), David et al.
patent: 6010652 (2000-01-01), Yoshida
patent: 6019138 (2000-02-01), Malek et al.
patent: 6103337 (2000-08-01), Burgess
patent: 6283168 (2001-09-01), Gu et al.
patent: 6418973 (2002-07-01), Cox et al.
patent: 6446675 (2002-09-01), Goering
patent: 6502788 (2003-01-01), Noda et al.
patent: 6702911 (2004-03-01), Toi et al.
patent: 6712099 (2004-03-01), Schmidt et al.
patent: 6733211 (2004-05-01), Durie
patent: 6733862 (2004-05-01), Goering
patent: 6835341 (2004-12-01), Noda et al.
patent: 6874543 (2005-04-01), Schmidt et al.
patent: 6899941 (2005-05-01), Goering et al.
patent: 7074474 (2006-07-01), Toi et al.
patent: 7413999 (2008-08-01), Goering
patent: 7655581 (2010-02-01), Goering
patent: 7712488 (2010-05-01), Goering et al.
patent: 7713893 (2010-05-01), Goering
patent: 2002/0192450 (2002-12-01), Schmidt et al.
patent: 2003/0056847 (2003-03-01), Schmidt et al.
patent: 2006/0121809 (2006-06-01), Goering
patent: 2008/0009210 (2008-01-01), Goering
patent: 2009/0149100 (2009-06-01), Goering
patent: 2009/0247034 (2009-10-01), Goering et al.
patent: 2010/0105260 (2010-04-01), Rae
patent: 2010/0105268 (2010-04-01), Ouellette et al.
patent: 2010/0105269 (2010-04-01), Goering et al.
patent: 2010/0167007 (2010-07-01), Goering
patent: 2010/0167616 (2010-07-01), Goering
International Search Report issued by European Patent Office for corresponding international application PCT/US2008/086973 mailed Mar. 24, 2009.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method for weaving substrates with integral sidewalls does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method for weaving substrates with integral sidewalls, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for weaving substrates with integral sidewalls will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2743694

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.