Optics: measuring and testing – Inspection of flaws or impurities – Transparent or translucent material
Patent
1986-03-25
1987-10-06
Willis, Davis L.
Optics: measuring and testing
Inspection of flaws or impurities
Transparent or translucent material
356 51, 361411, G01N 2188
Patent
active
046979239
ABSTRACT:
A method is disclosed for the visual inspection of electrical circuitry deposited in the layers of a multilayer printed circuit board wherein the dielectric layers of the multilayer board are prepared using a clear, light transparent thermosetting resin having incorporated therein a dye which is permeable to visible light but which absorbs light in the 320-440 nm region.
The electrical circuitry in the board can be easily traced by an observer upon illumination of the board by visible light.
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West et al., "Computer-Controlled Optical Testing of High Density Printed Circuit Boards" 1983, IBM J. Res. Develop. vol. 27, No. 1, pp. 50-58.
Jones Gerald W.
Pratt W. Robert
Summa William J.
IBM Corporation
Koren Matthew W.
Willis Davis L.
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