Optics: measuring and testing – Inspection of flaws or impurities
Reexamination Certificate
2008-07-08
2008-07-08
Pham, Hoa Q (Department: 2886)
Optics: measuring and testing
Inspection of flaws or impurities
C356S608000, C359S226200, C359S900000
Reexamination Certificate
active
11308428
ABSTRACT:
A method for verifying scan precision of a laser measurement machine includes the steps of: preparing a standardized BGA model; measuring Z coordinates values of each solder ball peak of the BGA model for certain times; determining a Z coordinates conventional true value of each solder ball peak; measuring X, Y coordinates values of each solder ball centre of the BGA model; determining a coplanarity conventional true value of a seating-plane; determining an optimum scanning mode; determining optimum scanning parameters under the optimum scanning mode; scanning the BGA model under the optimum scanning parameters and the optimum scanning mode; obtaining X, Y, Z coordinates values of each solder ball peak; evaluating the veracity of Z coordinates of each solder ball peak; evaluating the veracity and repetitiveness of coplanarity; and evaluating scan precision of the laser measurement machine.
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patent: 6879403 (2005-04-01), Freifeld
patent: 7256896 (2007-08-01), Que et al.
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patent: 2006/0221349 (2006-10-01), Que et al.
Lin Kuei-Yang
Que Ling-Hua
Xin Xiao-Bo
Xu Wei
Yuan Zhong-Kui
Hon Hai Precision Industry Co. Ltd.
Hong Fu Jin Precision Industry (Shen Zhen) Co., Ltd.
Hsu Winston
Pham Hoa Q
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