Method for using internal semiconductor junctions to aid in...

Details Method for using internal semiconductor junctions to aid in... Method for using internal semiconductor junctions to aid in...

2007-07-10

2007-07-10

Benson, Walter (Department: 2858)

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

Lumped type parameters

C324S658000, C324S765010

Reexamination Certificate

active

11478483

ABSTRACT:
Capacitive leadframe testing techniques are improved through knowledge of characteristics of semiconductor junctions specific to nodes of device under test (DUT) that are connected to nodes under test of the DUT.

REFERENCES:
patent: 5498964 (1996-03-01), Kerschner et al.
patent: 6600325 (2003-07-01), Coates et al.
patent: 6828815 (2004-12-01), Ishida et al.
patent: 6975978 (2005-12-01), Ishida et al.
patent: 2003/0016044 (2003-01-01), Ishida et al.

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