Patent
1997-08-22
1999-06-15
Beausoliel, Jr., Robert W.
G06F 1100
Patent
active
059130202
ABSTRACT:
A new method for masking off failing memory locations on a Single In-line Memory Module (SIMM) involves reading out identification (ID) codes fused in individual DRAMs. The ID codes are used to index stored fail maps taken from the DRAMs prior to their assembly onto a SIMM. After all failing locations of all of the DRAMs located on a single SIMM are determined, the SIMM is then programmed to re-route these locations to auxiliary memory located on the SIMM.
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Beausoliel, Jr. Robert W.
Elmore Stephen C.
Micron Electronics Inc.
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