Scanning-probe techniques or apparatus; applications of scanning – Monitoring the movement or position of the probe responsive...
Reexamination Certificate
2011-06-07
2011-06-07
Vanore, David A (Department: 2881)
Scanning-probe techniques or apparatus; applications of scanning
Monitoring the movement or position of the probe responsive...
C850S001000, C850S033000, C250S306000, C250S307000
Reexamination Certificate
active
07958563
ABSTRACT:
The present invention relates to a method of using an atomic force microscope comprising exciting natural lower and higher vibration modes of a microlever (M) placed on a sample, and analyzing the variation of one variable of a first output signal (Aicos(ωit−φi)) representative of the response of M to the excitation of the lower mode, with respect to the variation of a parameter influenced by one variable of a second output signal (Ajcos(ωjt−φj)) representative of the response of M to the excitation of the higher mode, and/or analyzing the variation of one variable of a second output signal (Ajcos(ωjt−φj)) representative of the response of M to the excitation of the higher mode, with respect to the variation of a parameter influenced by one variable of a first output signal (Aicos(ωit−φi)) representative of the response of M to the excitation of the lower mode.
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Caudrado Nicolas F. Martinez
Garcia Ricardo Garcia
Lozano Jose Luis Rodriguez
Patil Shivaprasad Vitthal
Consejo Superior de Investigaciones Cientificas
Leason Ellis LLP
Vanore David A
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