Method for universally testing semiconductor devices with...

Details Method for universally testing semiconductor devices with... Method for universally testing semiconductor devices with...

2006-04-25

2006-04-25

Tang, Minh N. (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S1540PB

Reexamination Certificate

active

07034564

ABSTRACT:
An apparatus for testing a semiconductor device is disclosed. According to the present invention, the apparatus includes a pair of input pins, a first conductive wire, a second conductive wire, a driver and a terminator. A device-under-test (DUT) is connected to one of the pair of input pins. The first conductive wire and the second conductive wire are connected in parallel between the pair of input pins. The driver is coupled to the first conductive wire via a third conductive wire, and the terminator is coupled to the second conductive wire via a fourth conductive wire.

REFERENCES:
patent: 4516816 (1985-05-01), Winthrop
patent: 6087843 (2000-07-01), Pun et al.
patent: 6339338 (2002-01-01), Eldridge et al.
patent: 6356096 (2002-03-01), Takagi et al.
patent: 6771087 (2004-08-01), Oz et al.

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