Method for transferring wafers

Semiconductor device manufacturing: process – With measuring or testing – Packaging or treatment of packaged semiconductor

Reexamination Certificate

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Details

C438S017000, C438S020000, C438S455000, C438S458000, C438S463000, C257SE21122, C257SE21238, C257SE21505, C257SE21599, C257SE21705

Reexamination Certificate

active

07807482

ABSTRACT:
The invention concerns a method for preparing a thin layer (28) or a chip to be transferred onto another substrate, this method including the realization, above the surface of said thin layer or said chip, of at least one layer, called adhesive layer (25), and of at least one layer, called first barrier layer (22), the adhesive layer being made of a material of which etching presents selectivity in relation to the material of the barrier layer.

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