Semiconductor device manufacturing: process – With measuring or testing – Packaging or treatment of packaged semiconductor
Reexamination Certificate
2005-06-02
2010-10-05
Lebentritt, Michael S (Department: 2829)
Semiconductor device manufacturing: process
With measuring or testing
Packaging or treatment of packaged semiconductor
C438S017000, C438S020000, C438S455000, C438S458000, C438S463000, C257SE21122, C257SE21238, C257SE21505, C257SE21599, C257SE21705
Reexamination Certificate
active
07807482
ABSTRACT:
The invention concerns a method for preparing a thin layer (28) or a chip to be transferred onto another substrate, this method including the realization, above the surface of said thin layer or said chip, of at least one layer, called adhesive layer (25), and of at least one layer, called first barrier layer (22), the adhesive layer being made of a material of which etching presents selectivity in relation to the material of the barrier layer.
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Aspar Bernard
Lagahe-Blanchard Chrystelle
Lebentritt Michael S
Nixon & Peabody LLP
S.O.I.TEC Silicon on Insulator Technologies
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