Method for thickness calibration and measuring thickness of...

Details Method for thickness calibration and measuring thickness of... Method for thickness calibration and measuring thickness of...

2010-02-23

2011-12-13

Song, Hoon (Department: 2882)

X-ray or gamma ray systems or devices

Specific application

Absorption

C378S207000

Reexamination Certificate

active

08077827

ABSTRACT:
A method for measuring the thickness of a first absorbing material in the presence of a second absorbing material is provided. The method comprises the steps as follow. The thickness (tS) of the first absorbing material is fixed and the thickness of the second absorbing material is varied to obtain a calibration standard. The intensity of the transmissive energy passing through the calibration standard is detected by acquiring multiple pairs of image data comprising a foreground value (logn(Ic+s)) and a background value (logn(Ic)). The thickness (tSi) of the first absorbing material is changed and the above steps are repeated to obtain sets of image data. A fitting constant Idis determined to describe each set of the intensity data asμsα⁢tS=logn⁡(Ic+Id)-logn⁡(Ic+s+Id).A best fit of the proportional constantμsαis determined to further calculate an unknown thickness of the first absorbing material (ts′) through the equationts′=αμs⁡[ln⁡(Ic′+Id)-ln⁡(Ic+s′+Id)].

REFERENCES:
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patent: 5923726 (1999-07-01), Regimand
patent: 6148057 (2000-11-01), Urchuk et al.
patent: 6201850 (2001-03-01), Heumann

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