Electricity: measuring and testing – Plural – automatically sequential tests
Reexamination Certificate
2009-05-14
2011-11-22
Phan, Huy Q (Department: 2858)
Electricity: measuring and testing
Plural, automatically sequential tests
C324S605000, C324S607000, C324S765010, C702S108000, C702S115000
Reexamination Certificate
active
08063626
ABSTRACT:
The present invention refers to a method for the precise measurement of dependency on amplitude and phase of a plurality of high frequency signals, preferably in the synchrotron accelerator of elementary particles. The essence of the solution according to the invention lies in that with a single measuring device and without any aliasing it is achieved a resolution of 0.2 micron and repeatability of measurements of 1 micron down to the lower frequency limit of a few MHz. A method according to the invention includes alternately directing, with a radio frequency (RF) switch, each analogue input signal to each of a plurality of RF processing units; amplifying each analogue input signal in each RF processing unit in order to adjust signals to the measuring range of a plurality of analog-digital (A/D) converters; directing each amplified analogue input signal to each of a plurality of A/D converters; converting the analogue signals to digital signals; directing the digital signals to a digital corrector; correcting the digital signals by means of correcting signals from the inverse models of evaluated systematic errors; collecting corrected digital signals in a digital switch and directing the ordered recombined number of digital signals to each of a plurality of digital receivers; and filtering the recombined number of digital signals in a plurality of low-pass filters.
REFERENCES:
patent: 5001416 (1991-03-01), Bittner et al.
patent: 6972552 (2005-12-01), Ursic
patent: 2006/0259197 (2006-11-01), Boe et al.
Baricevic Borut
Karcnik Tomaz
Lemut Primoz
Poucki Vladimir
Solar Borut
Beem Patent Law Firm
Chan Emily
Instrumentation Technologies d.d.
Phan Huy Q
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