Method for the measurment of capacitance, with application to li

Details Method for the measurment of capacitance, with application to li Method for the measurment of capacitance, with application to li

1990-12-17

1993-02-23

Harvey, Jack B.

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

Lumped type parameters

324661, 324678, G01R 2726

Patent

active

051893762

ABSTRACT:
A technique for measuring capacitance and displacement, in which two circuits are combined, one that produces a current proportional to capacitance, and another that integrates that current between two reference levels, and supplies an output proportional to the integration time. In preferred embodiments, the first circuit is a capacitive pump circuit, and the second circuit a dual-slope integrator.

REFERENCES:
patent: 3706919 (1972-12-01), Abbe
patent: 3836847 (1974-09-01), Lucas
patent: 3990005 (1976-11-01), Abbe et al.
patent: 4160204 (1979-07-01), Holmgren et al.
patent: 4187459 (1980-02-01), Wolfendale
patent: 4187460 (1980-02-01), Dauge et al.
patent: 4217542 (1980-08-01), Abbe et al.
patent: 4217543 (1980-08-01), Strong
patent: 4243933 (1981-01-01), Rollman
patent: 4353029 (1982-10-01), Abbe et al.
patent: 4675596 (1987-06-01), Smith
patent: 4743836 (1988-05-01), Grzybowski et al.
patent: 4924172 (1990-05-01), Holmgren

Affiliated with

Also associated with

Rating

Method for the measurment of capacitance, with application to li does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method for the measurment of capacitance, with application to li, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for the measurment of capacitance, with application to li will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-2208297