Data processing: measuring – calibrating – or testing – Measurement system – Statistical measurement
Reexamination Certificate
2008-02-04
2010-02-23
Le, John H (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system
Statistical measurement
C073S001010, C324S115000, C342S171000, C702S053000
Reexamination Certificate
active
07668693
ABSTRACT:
A method for evaluating uncertainty associated with the value of a measurand derived from measurements of a device under test is disclosed. A mathematical model is provided wherein the measurand is expressed as a function of (i) at least one physically observable quantity, and (ii) the reference value of the physically observable quantity in a reference device. The reference value of the reference device and the value of the measurand of the device under test are measured. The value of the at least one physically observable quantity is also measured. At least one uncertainty value is determined as a function of the physically observable, wherein the mathematical model takes into account the at least one source of uncertainty and the reference value of the reference device.
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Endo Tadashi
Yoshihiro Kazuo
Calibration & Testing International Pte., Ltd.
Le John H
Woodard Emhardt Moriarty McNett & Henry LLP
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