Method for the differential measurement of the angle of incidenc

Optics: measuring and testing – Angle measuring or angular axial alignment – Apex of angle at observing or detecting station

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

3561412, 356351, G01B 1126

Patent

active

057643512

ABSTRACT:
The method for the differential measurement of an angle of incidence of a luminous beam uses a polarized light beam which is passed twice through a birefringent plate followed by a polarizing analyzer in order to obtain a succession of interference fringes. The orientation or the mutual spacing between the crests of said fringes, which are a direct function of the measured angle (.gamma.), are analyzed by means of a suitable detector and of an electronic analyzing circuit. The measuring device comprises a single polarizing analyzer, a birefringent plate which is followed by a mirror in order to reflect the light beam through said birefringent plate a second time, and means for detecting the variations of the luminous intensity including an electronic analyzing circuit. The use of a double passage through a birefringent plate ajusts the optical elements in one plane (V) in order to optimize the efficiency and the sensitivity while measuring in the other plane (H), thus obtaining a device which is simple and at the same time very sensitive to angular displacements, for example for the measurement of vibrations.

REFERENCES:
patent: 3670168 (1972-06-01), Low et al.
patent: 3881105 (1975-04-01), De Lang et al.
patent: 4624563 (1986-11-01), Johnson
patent: 4626100 (1986-12-01), Johnson
patent: 4682024 (1987-07-01), Halldorsson et al.
patent: 4735507 (1988-04-01), Crane, Jr. et al.
patent: 5182612 (1993-01-01), Rheme
patent: 5191392 (1993-03-01), Johnson
patent: 5351124 (1994-09-01), Laskoskie et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method for the differential measurement of the angle of incidenc does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method for the differential measurement of the angle of incidenc, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for the differential measurement of the angle of incidenc will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2207049

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.