Method for the differential measurement of the angle of incidenc

Details Method for the differential measurement of the angle of incidenc Method for the differential measurement of the angle of incidenc

1996-07-19

1998-06-09

Hellner, Mark

Optics: measuring and testing

Angle measuring or angular axial alignment

Apex of angle at observing or detecting station

3561412, 356351, G01B 1126

Patent

active

057643512

ABSTRACT:
The method for the differential measurement of an angle of incidence of a luminous beam uses a polarized light beam which is passed twice through a birefringent plate followed by a polarizing analyzer in order to obtain a succession of interference fringes. The orientation or the mutual spacing between the crests of said fringes, which are a direct function of the measured angle (.gamma.), are analyzed by means of a suitable detector and of an electronic analyzing circuit. The measuring device comprises a single polarizing analyzer, a birefringent plate which is followed by a mirror in order to reflect the light beam through said birefringent plate a second time, and means for detecting the variations of the luminous intensity including an electronic analyzing circuit. The use of a double passage through a birefringent plate ajusts the optical elements in one plane (V) in order to optimize the efficiency and the sensitivity while measuring in the other plane (H), thus obtaining a device which is simple and at the same time very sensitive to angular displacements, for example for the measurement of vibrations.

REFERENCES:
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patent: 3881105 (1975-04-01), De Lang et al.
patent: 4624563 (1986-11-01), Johnson
patent: 4626100 (1986-12-01), Johnson
patent: 4682024 (1987-07-01), Halldorsson et al.
patent: 4735507 (1988-04-01), Crane, Jr. et al.
patent: 5182612 (1993-01-01), Rheme
patent: 5191392 (1993-03-01), Johnson
patent: 5351124 (1994-09-01), Laskoskie et al.

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