Method for the contactless determination of a thickness of a...

Electricity: measuring and testing – Magnetic – With means to create magnetic field to test material

Reexamination Certificate

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C324S207150, C324S230000, C324S202000

Reexamination Certificate

active

10561258

ABSTRACT:
With a method for the contactless determination of a thickness of a layer (20) made of electrically-conductive material of a component (17), a sensor composed of a coil form (13) and a coil (14) is positioned in the vicinity of the component (17) to be measured. The method is based on a combination of the principles of induction and eddy current. The thickness of the layer (20) is determined using a plurality of measuring and evaluation steps in which the coil (14) is acted upon with a first alternating current frequency f1and a second alternating current frequency f2, and its change in inductance is evaluated. The distance between the coil form (13) and, therefore, the coil (14), and the component (17) is derived from the inductance value of the coil (14) acted upon with the second alternating current frequency f2.

REFERENCES:
patent: 5889401 (1999-03-01), Jourdain et al.
patent: 6198278 (2001-03-01), Dobler et al.
patent: 6369565 (2002-04-01), Dobler et al.
patent: 6377039 (2002-04-01), Goldfine et al.
patent: 6479990 (2002-11-01), Mednikov et al.
patent: 196 28 220 (1998-02-01), None
patent: 196 52 750 (1998-07-01), None
patent: 198 20 546 (1999-11-01), None
patent: 199 08 360 (2000-06-01), None
patent: 99/58923 (1999-11-01), None

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