Method for the chemical vapor deposition of copper-based films a

Compositions: coating or plastic – Coating or plastic compositions – Metal-depositing composition or substrate-sensitizing...

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

106 126, 10628718, 556 40, C09D 500, C07F 108

Patent

active

060661968

ABSTRACT:
A method for depositing copper-based films and a copper source precursor for use in the chemical vapor deposition of copper-based films are provided. The precursor includes a mixture of at least one ligand-stabilized copper (I) .beta.-diketonate precursor; and at least one copper(II) .beta.-diketonate precursor. The method includes introducing into a deposition chamber: (i) a substrate; (ii) a copper source precursor in a vapor state including a mixture of at least one ligand-stabilized copper (I) .beta.-diketonate precursor; and at least one copper(II) .beta.-diketonate precursor; and (iii) at least one transport gas, different than said copper source precursor. The reaction substrate temperature is maintained at from about 50.degree. C. to about 500.degree. C. for a period of time sufficient to deposit a copper-based film on said substrate.

REFERENCES:
patent: Re35614 (1997-09-01), Norman et al.
patent: 5085731 (1992-02-01), Norman et al.
patent: 5096737 (1992-03-01), Baum et al.
patent: 5098516 (1992-03-01), Norman et al.
patent: 5144049 (1992-09-01), Norman et al.
patent: 5145714 (1992-09-01), Reisman et al.
patent: 5187300 (1993-02-01), Norman
patent: 5220044 (1993-06-01), Baum et al.
patent: 5273775 (1993-12-01), Dyer et al.
patent: 5744192 (1998-04-01), Nguyen et al.
patent: 5767301 (1998-06-01), Senzaki et al.
patent: 5817367 (1998-10-01), Chun et al.
patent: 5820664 (1998-10-01), Gardiner et al.
Zheng, et al, "Device-quality copper using chemical vapor deposition of .beta.-diketonate source precursors in liquid solution", Appl. Phys. Lett., vol. 61, No. 18, (1992), pp. 2175-2177.
Stephen M. Fine, et al, "Organometallic Chemical Vapor Deposition of Copper from a New Organometallic Precursor", Mat. Res. Soc. Symp. Proc. vol. 204 (1991), pp. 415-419.
Shine et al, "Synthesis of New Copper (I) .beta.-Diketonate Compounds for CVD of Copper," Mat. Res. Soc. Symp. Proc. vol. 204 (1991), 421-426.
Alain E. Kaloyeros, et al. "Chemical Vapor Deposition of Copper for Multilevel Metallization," MRS Bulletin, (1993), pp. 22-29.
A. Jain, et al., "Selective CVD of Copper on Tungsten Versus Sio.sub.2 from (B-diketonate)cul.sub.n Copper (I) Precursors Via Sio.sub.2 Surface Modification," Conference Proc. ULSI-VIII (1993) Materials Research Society, pp. 83-89.
J.A.T. Norman, et al., "Chemical additives for improved copper chemical vapour deposition processing", Thin Solid Films 262 (1995), pp. 46-51.
M.B. Naik, et al., "CVD of copper using copper (I) and copper (II) .beta.-diketonates," Thin Solid Films 262 (1995), pp. 60-66.
J.A.T. Norman, et al., "A new metal-organic chemical vapor deposition process for selective copper metallization," Materials Science and Engineering, B17 (1993), pp. 87-92.
A. Jain, et al., "Chemical Vapor Deposition of Copper from Hexafluoroacetylacetonato Copper (I) Vinyltrimethylsilane," J. Electrochem. Soc., vol. 140, No. 5, May 1993, pp. 1434-1439.
G.A. Petersen, et al., "Enhanced Chemical Vapor Deposition of Copper from (hfac)Cu(TMVS) Using Liquid Coinjection of TMVS," J. Electrochem. Soc., vol. 142, No. 3, Mar. 1995, pp. 939-944.
S.M. Fine, et al., "Consecutive Selective Chemical Vapor Deposition of Copper and Aluminum from Organometallic Precursors," Mat. Res. Soc. Symp. Proc. vol. 282, (1993), pp. 329-334.
D. P. Tracy, et al., "Texture and Microstructure of Thin Copper Films," J. Electronic Materials, vol. 22, No. 6, 1993, pp. 611-616.
H.K. Shin, et al., "MOCVD of Copper from New and Liquid Precursors (hfac)CuL, where L=1-pentene, ATMS, and VTMOS," Mat. Res. Soc. Symp. Proc. vol. 427 (1996), pp. 219-223.
J. Nucci, et al., "In-situ Analysis of the Microstructure of Thermally Treated Thin Copper Films," Mat. Res. Soc. Symp. Proc. vol. 309 (1993), pp. 377-382.
S.P. Murarka, et al., "Advanced multilayer metallization schemes with copper as interconnection metal," Thin Solid Films, 236 (1993), pp. 257-266.
Jung-Chao Chiou, et al., "The Processing Windows for Selective Copper Chemical Vapor Deposition from Cu(hexafluoroacetylacetonate)trimethylvinylsilane," J. Electrochem. Soc., vol. 142, No. 1, (1995), pp. 177-182.
N. Awaya, et al., "Deposition Mechanism of Copper CVD," Adv. Met. For ULSI Appl. MRS (1992), pp. 345-353.
T. Welton, et al., "MOCVD of Copper on Tungsten: Carbon Contamination at the Interface," Adv. Met. For ULSI Appl., MRS (1992), pp. 383-388.
S. Poston, et al., "Density Determination of Silver Neodecanoate, Tungsten Hexacarbonyl, and a Series of Metal Acetylacetonate and Hexafluoroacetylacetonates", J. Electronic Materials, vol. 18, No. 1, (1989), pp. 79-84.
C. Oehr, et al., "Thin Copper Films by Plasma CVD Using Copper-Hexafluoro-Acetylacetonate", Appl. Phys., A 45, 151-154 (1988).
R. L. Van Hemert, et al., "Vapor Deposition of Metals of Hydrogen Reduction of Metal Chelates", J. Electrochem. Soc., vol. 112, (1963), pp. 1123-1125.
Chih-Chen Cho, "Enhanced Chemical Vapor Deposition of Copper", Conf. Proc., VLSI VI (1991) pp. 189-194.
A. V. Gelatos, et al., "Chemical Vapor Deposition of Copper from Cu.sup.+1 precursors in the Presence of Water Vapor", Appl. Phys. Lett., vol. 63, No. 20, (1993), pp. 2842-2844.
A. Jain, et al., "Selective and blanket copper chemical vapor deposition for ultra-large-scale integration", J. Vac. Sci. Technol. B., vol. 11, No. 6 (1993), pp. 2107-2113.
H. Li, et al., "Remote plasma chemical vapor deposition of copper for applications in microelectronics", J. Vac. Sci. Tehcnol. B., vol. 10, No. 4 (1992), pp. 1337-1340.
E.T. Eisenbraun, et al., "Enhanced growth of device-quality copper by hydrogen plasma-assisted chemical vapor deposition," Appl. Phys. Lett., vol. 60, No. 25 (1992) pp. 3126-3128.
SLA Semiconductor Industry Association-The National Technology Roadmap for Semiconductors, 1994 (pp. 94-99).
P. Jeffries, Chemical Vapor Deposition of Copper and Copper Oxide Thin Films from Copper (I) tert-Butoxide, Chem. Of Materials vol. 1, pp. 8-12 (1989).

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method for the chemical vapor deposition of copper-based films a does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method for the chemical vapor deposition of copper-based films a, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for the chemical vapor deposition of copper-based films a will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-1834467

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.