Data processing: measuring – calibrating – or testing – Calibration or correction system – Sensor or transducer
Reexamination Certificate
2007-11-20
2007-11-20
Tsai, Carol S. W. (Department: 2857)
Data processing: measuring, calibrating, or testing
Calibration or correction system
Sensor or transducer
C702S091000, C702S094000, C702S152000, C702S167000, C356S601000
Reexamination Certificate
active
11486370
ABSTRACT:
The present invention relates to an improved method for the simultaneous calibration and qualification of a non-contact probe on a localizer using a single artifact, in which non-contact probe readings and localizer readings are synchronised using parameters determined simultaneously with calibration and qualification. The invention also relates to a non-contact probe and other devices, and a computer program for performing the invention.
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File History of U.S. Patent No. 6,944,564 obtained from PTO IFW Jun. 20, 2007.
Coppenolle Bart Van
De Jonge Lieven
Vanderstraeten Denis
Metris N.V.
Tsai Carol S. W.
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