Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate
2006-07-04
2006-07-04
Lee, Diane (Department: 2858)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
C324S649000, C324S115000, C702S104000
Reexamination Certificate
active
07071712
ABSTRACT:
A method for the automatic identification of sensor sensitivity, according to which resistance of a specific magnitude is allocated to the sensor. The resistance is used to allocate the sensor to a specific sensor group with a predetermined sensitivity range.
REFERENCES:
patent: 4473797 (1984-09-01), Shiota
patent: 4524349 (1985-06-01), Hyatt
patent: 4695955 (1987-09-01), Faisandier
patent: 5256960 (1993-10-01), Novini
patent: 5606515 (1997-02-01), Mockapetris et al.
Bachman & LaPointe P.C.
Kramskaya Marina
Lee Diane
Priamus System Technology AG
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